Characterising the Digital Twin: A systematic literature review

David Jones, Chris Snider, Aydin Nassehi, Jason Yon, Ben Hicks

Journal: CIRP Journal of Manufacturing Science and Technology

Publisher: Elsevier BV

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.