Sensitive measurement of optical nonlinearities using a single beam

M. Sheik-Bahae, A.A. Said, T.-H. Wei, D.J. Hagan, E.W. Van Stryland

Journal: IEEE Journal of Quantum Electronics

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.