On combining classifiers

J. Kittler, M. Hatef, R.P.W. Duin, J. Matas

Journal: IEEE Transactions on Pattern Analysis and Machine Intelligence

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.