Learning a Similarity Metric Discriminatively, with Application to Face Verification

S. Chopra, R. Hadsell, Y. LeCun

Journal: 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05)

Publisher: IEEE

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.