Rich Feature Hierarchies for Accurate Object Detection and Semantic Segmentation

Ross Girshick, Jeff Donahue, Trevor Darrell, Jitendra Malik

Journal: 2014 IEEE Conference on Computer Vision and Pattern Recognition

Publisher: IEEE

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.