Geometric Deep Learning: Going beyond Euclidean data

Michael M. Bronstein, Joan Bruna, Yann LeCun, Arthur Szlam, Pierre Vandergheynst

Journal: IEEE Signal Processing Magazine

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.