Statistics of Speckle in Ultrasound B-Scans

R.F. Wagner, S.W. Smith, J.M. Sandrik, H. Lopez

Journal: IEEE Transactions on Sonics and Ultrasonics

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.