Least-Squares Fitting of Two 3-D Point Sets

K. S. Arun, T. S. Huang, S. D. Blostein

Journal: IEEE Transactions on Pattern Analysis and Machine Intelligence

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.