Multiresolution gray-scale and rotation invariant texture classification with local binary patterns

T. Ojala, M. Pietikainen, T. Maenpaa

Journal: IEEE Transactions on Pattern Analysis and Machine Intelligence

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.