SLIC Superpixels Compared to State-of-the-Art Superpixel Methods

R. Achanta, A. Shaji, K. Smith, A. Lucchi, P. Fua, Sabine Süsstrunk

Journal: IEEE Transactions on Pattern Analysis and Machine Intelligence

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.