Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly

Yongqin Xian, Christoph H. Lampert, Bernt Schiele, Zeynep Akata

Journal: IEEE Transactions on Pattern Analysis and Machine Intelligence

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.