Intrusion Detection for Cybersecurity of Smart Meters

Chih-Che Sun, D. Jonathan Sebastian Cardenas, Adam Hahn, Chen-Ching Liu

Journal: IEEE Transactions on Smart Grid

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.