High resolution optical frequency domain reflectometry for characterization of components and assemblies

Brian J. Soller, Dawn K. Gifford, Matthew S. Wolfe, Mark E. Froggatt

Journal: Optics Express

Publisher: Optica Publishing Group

Citations are the number of DOI-registered works in Crossref that cite this paper; references are how many works it cites. Full text is on the publisher site via the DOI link.